Equipment

X-ray diffraction:

• FIXDIF (Flexible In situ X-ray Diffractometer)
  Mar345 Imaging Plate and Point Detectors
  Mo rotating anode
• 2 four-circle diffractometers
  Xcalibur (Oxford Diffraction with CCD)
  CAD-4 (Enraf Nonius)
  standard high- and low-temperature equipment (-170^oC to 750^oC )
• Six-circle diffractometer
  Seiffert
• 3 powder diffractometers
  X-Pert PRO-MPD (PanAlytical), reflection geometry with various modes/attachments
  STADI P (Stoe), transmission (or reflection) geometry
  with 5^o linear detector and 130^o curved imaging plate detector
  PAD-X (Scintag), reflection geometry
  standard cooling and heating devices (20-2000K)
• Mar300 Imaging Plate scanner system
  with a specially designed low-background high-temperature furnace (up to 1200^oC)
  Mo rotating anode
  optional parallel-beam optics

Laboratory Equipment

• Dilatometer (Netzsch DIL402C) for thermal expansion measurements in the ranges
  -170^oC to 490^oC (low-temperature furnace)
  200^oC to 1500^oC (high-temperature furnace)
• DTA (Perkin Elmer DTA 7), up to 1600^oC
• TGA (Mettler)
• Thermostate (modified Lauda D30KP) for crystal growth from solutions (10^oC - 230^oC),
• High vacuum furnace (Pfeiffer MOV 064) up to 2400^oC
• Induction furnace (Huettinger TIG 5/300) 5kW,
• Chamber furnace with controlled atmosphere (Linn HT 1800 VAC) up to 1800^oC
• Electric arc furnace (Siemens)
• Tube furnaces
• Inert gas system (Braun MB 150 B-G-I 1800/780)
  with integrated gas-purification system and SPS1

Computers:

• Mac X-serve Cluster with 20 G5 Dual Nodes
• HPGS1280 Cluster with 8 Processors
• DEC Alpha AXP 4000/720
• SGI Octane2 (2x R12000)
• SGI Octane
• numerous Mac's and PC's